author = "Vázquez, M." > : "E.T.S.I. Industriales (UPM)" (x)
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Encontrado 2 documentos, página mostrada 1 de 1

Crack origin and detection in thin cristallyne solar cells in a production line

Description: In order to reduce cost and make up for the rising price of silicon, silicon wafers are sliced thinner and wider,eading to weaker wafers and increased breakage rates during fabrication process. In this work we have analysed different cracks origins and their effect on wafer’s mechanical strength. To...
Language(s): Inglés

Crack origin and detection in thin cristallyne solar cells in a production line

Description: In order to reduce cost and make up for the rising price of silicon, silicon wafers are sliced thinner and wider,eading to weaker wafers and increased breakage rates during fabrication process. In this work we have analysed different cracks origins and their effect on wafer’s mechanical strength. To...
Language(s): Inglés
1

Encontrado 2 documentos, página mostrada 1 de 1

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