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Dataset.

Supporting Information for "Terahertz twistoptics-engineering canalized phonon polaritons"

Digital.CSIC. Repositorio Institucional del CSIC
oai:digital.csic.es:10261/346528
Digital.CSIC. Repositorio Institucional del CSIC
  • Obst, Maximilian
  • Nörenberg, Tobias
  • Álvarez-Pérez, Gonzalo
  • Oliveira, Thales V. A. G. de
  • Taboada-Gutiérrez, Javier
  • Feres, Flávio H.
  • Kaps, Felix G.
  • Hatem, Osama
  • Luferau, Andrei
  • Nikitin, Alexey Y.
  • Klopf, J. Michael
  • Alonso-González, Pablo
  • Kehr, Susanne C.
  • Eng, Lukas M.
Details on α-MoO3 THz permittivity data, additional measurements at all mentioned frequencies, details on data processing, the extraction of HPhP confinements and quality factors from line profiles, and an overview of extracted properties as well as a remark on the influence of sample thickness, sample preparation, and FEL and setup parameters., Peer reviewed
 
DOI: http://hdl.handle.net/10261/346528
Digital.CSIC. Repositorio Institucional del CSIC
oai:digital.csic.es:10261/346528

HANDLE: http://hdl.handle.net/10261/346528
Digital.CSIC. Repositorio Institucional del CSIC
oai:digital.csic.es:10261/346528
 
Ver en: http://hdl.handle.net/10261/346528
Digital.CSIC. Repositorio Institucional del CSIC
oai:digital.csic.es:10261/346528
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Digital.CSIC. Repositorio Institucional del CSIC
oai:digital.csic.es:10261/346528
Dataset. 2023

SUPPORTING INFORMATION FOR "TERAHERTZ TWISTOPTICS-ENGINEERING CANALIZED PHONON POLARITONS"

Digital.CSIC. Repositorio Institucional del CSIC
  • Obst, Maximilian
  • Nörenberg, Tobias
  • Álvarez-Pérez, Gonzalo
  • Oliveira, Thales V. A. G. de
  • Taboada-Gutiérrez, Javier
  • Feres, Flávio H.
  • Kaps, Felix G.
  • Hatem, Osama
  • Luferau, Andrei
  • Nikitin, Alexey Y.
  • Klopf, J. Michael
  • Alonso-González, Pablo
  • Kehr, Susanne C.
  • Eng, Lukas M.
Details on α-MoO3 THz permittivity data, additional measurements at all mentioned frequencies, details on data processing, the extraction of HPhP confinements and quality factors from line profiles, and an overview of extracted properties as well as a remark on the influence of sample thickness, sample preparation, and FEL and setup parameters., Peer reviewed

HANDLE: http://hdl.handle.net/10261/346528


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